Papers

Export 5 results:
Filters: Author is Lopes, Cristina V.  [Clear All Filters]
A B C D E F G H I J K L M N O P Q R S T U V W X Y Z 
Empirical Research
V. Saini, Sajnani, H., Ossher, J., and Lopes, C. V., A Dataset for Maven Artifacts and Bug Patterns Found in Them, in Proceedings of the 11th Working Conference on Mining Software Repositories, New York, NY, USA, 2014, pp. 416–419.
Empirical software engineering
V. Saini, Sajnani, H., Ossher, J., and Lopes, C. V., A Dataset for Maven Artifacts and Bug Patterns Found in Them, in Proceedings of the 11th Working Conference on Mining Software Repositories, New York, NY, USA, 2014, pp. 416–419.
findbugs
V. Saini, Sajnani, H., Ossher, J., and Lopes, C. V., A Dataset for Maven Artifacts and Bug Patterns Found in Them, in Proceedings of the 11th Working Conference on Mining Software Repositories, New York, NY, USA, 2014, pp. 416–419.
maven
V. Saini, Sajnani, H., Ossher, J., and Lopes, C. V., A Dataset for Maven Artifacts and Bug Patterns Found in Them, in Proceedings of the 11th Working Conference on Mining Software Repositories, New York, NY, USA, 2014, pp. 416–419.
software quality
V. Saini, Sajnani, H., Ossher, J., and Lopes, C. V., A Dataset for Maven Artifacts and Bug Patterns Found in Them, in Proceedings of the 11th Working Conference on Mining Software Repositories, New York, NY, USA, 2014, pp. 416–419.