Contains the keyword scm

Izquierdo-Cortázar D, Robles G, González-Barahona JM. Do More Experienced Developers Introduce Fewer Bugs?. IFIP Advances in Information and Communication Technology 378 (OSS 2012). IFIP AICT, Springer; 2012. pp. 268-273.
McIntosh S, Adams B, Hassan AE. The evolution of Java build systems. Empirical Software Engineering. 2012;17(4-5):578 - 608.
Izquierdo-Cortazar D, Capiluppi A, Gonzalez-Barahona JM. Are Developers Fixing Their Own Bugs?. International Journal of Open Source Software and Processes. 2011;3(2):23 - 42.
van Antwerp M, Madey G. Warehousing and Studying Open Source Versioning Metadata. Ågerfalk Pär, Boldyreff C, González-Barahona JM, Madey GR, Noll J. IFIP Advances in Information and Communication Technology Open Source Software: New Horizons (OSS 2010). Berlin, Heidelberg: Springer Berlin Heidelberg; 2010. pp. 413 - 418.
D'Ambros M, Lanza M, Robbes R. An extensive comparison of bug prediction approaches. In 2010 7th IEEE Working Conference on Mining Software Repositories (MSR 2010)2010 7th IEEE Working Conference on Mining Software Repositories (MSR 2010). Cape Town, South Africa: IEEE; 2010. pp. 31 - 41. PDF icon 31dambrosLanzaRobbes31.pdf (408.78 KB)
Rahman F, Bird C, Devanbu P. Clones: What is that smell?. In 2010 7th IEEE Working Conference on Mining Software Repositories (MSR 2010)2010 7th IEEE Working Conference on Mining Software Repositories (MSR 2010). Cape Town, South Africa: IEEE; 2010. pp. 72 - 81. PDF icon 72rahman2010cws.pdf (691.59 KB)
Bird C, Rigby PC, Barr ET, Hamilton DJ, Germán DM, Devanbu PT. The promises and perils of mining git. In Proceedings of the 6th International Working Conference on Mining Software Repositories, MSR 2009. 2009. pp. 1-10. PDF icon 1promisePeril.pdf (641.01 KB)
Maalej W, Happel H-J. From work to word: How do software developers describe their work?. In 2009 6th IEEE International Working Conference on Mining Software Repositories (MSR)2009 6th IEEE International Working Conference on Mining Software Repositories. Vancouver, BC, Canada: IEEE; 2009. pp. 121 - 130.

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